PALCE16V8
Output Current into Outputs (LOW)............................. 24 mA
DC Programming Voltage............................................. 12.5V
Latch-Up Current..................................................... >200 mA
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .................................–65°C to +150°C
Operating Range
Ambient Temperature with
Ambient
Power Applied.............................................–55°C to +125°C
Range
Commercial
Military[1]
Temperature
VCC
Supply Voltage to Ground Potential
(Pin 24 to Pin 12) ........................................... –0.5V to +7.0V
0°C to +75°C
5V ±5%
5V ±10%
5V ±10%
DC Voltage Applied to Outputs
in High Z State............................................... –0.5V to +7.0V
–55°C to +125°C
–40°C to +85°C
Industrial
DC Input Voltage............................................ –0.5V to +7.0V
Electrical Characteristics Over the Operating Range[2]
Parameter
Description
Test Conditions
IOH = –3.2 mA
IOH = –2 mA
IOL = 24 mA
Min.
Max. Unit
VOH
Output HIGH Voltage
VCC = Min.,
VIN = VIH or VIL
Com’l
Mil/Ind
Com’l
Mil/Ind
2.4
V
VOL
Output LOW Voltage
VCC = Min.,
VIN = VIH or VIL
0.5
V
IOL = 12 mA
VIH
Input HIGH Level
Input LOW Level
Guaranteed Input Logical HIGH Voltage for All Inputs[3]
Guaranteed Input Logical LOW Voltage for All Inputs[3]
2.0
V
V
[4]
VIL
–0.5
0.8
10
IIH
Input or I/O HIGH Leakage 3.5V < VIN < VCC
Current
µA
[5]
IIL
Input or I/O LOW Leakage
Current
Output Short Circuit Current VCC = Max., VOUT = 0.5V[6, 7]
0V < VIN < VIN (Max.)
–100 µA
–150 mA
ISC
ICC
–30
Operating Power Supply
Current
VCC = Max.,
VIL = 0V, VIH = 3V,
Output Open,
f = 15 MHz
5, 7 ns
Com’l
115
90
mA
mA
mA
mA
mA
mA
10, 15, 25 ns
15L, 25L ns
10, 15, 25 ns
15L, 25L ns
15L, 25L ns
55
(counter)
Mil/Ind
Mil.
130
65
Ind.
65
Capacitance[7]
Parameter
CIN
Description
Input Capacitance
Output Capacitance
Test Conditions
Typ.
Unit
VIN = 2.0V @ f = 1 MHz
VOUT = 2.0V @ f = 1 MHz
5
5
pF
pF
COUT
Endurance Characteristics[7]
Parameter
Description
Minimum Reprogramming Cycles
Test Conditions
Min.
100
Max.
Unit
N
Normal Programming Conditions
Cycles
Notes:
1. TA is the “instant on” case temperature.
2. See the last page of this specification for Group A subgroup testing information.
3. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
4.
VIL (Min.) is equal to –3.0V for pulse durations less than 20 ns.
5. The leakage current is due to the internal pull-up resistor on all pins.
6. Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. VOUT = 0.5V has been chosen to avoid test problems
caused by tester ground degradation.
7. Tested initially and after any design or process changes that may affect these parameters.
Document #: 38-03025 Rev. **
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