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C450EZ400-S12000-2 参数 Datasheet PDF下载

C450EZ400-S12000-2图片预览
型号: C450EZ400-S12000-2
PDF下载: 下载PDF文件 查看货源
内容描述: [Single Color LED,]
分类和应用: 光电
文件页数/大小: 6 页 / 326 K
品牌: CREE [ CREE, INC ]
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Maximum Ratings at TA = 25°CNotes 1&3  
DC Forward Current  
CxxxEZ400-Sxx00-2  
200 mA  
Peak Forward Current (1/10 duty cycle @ 1 kHz)  
LED Junction Temperature  
350 mA  
150°C  
Reverse Voltage  
5 V  
Operating Temperature Range  
-40°C to +100°C  
-40°C to +120°C  
≤30°C / ≤85% RH  
2000 V  
LED Chip Storage Temperature Range  
Recommended Die Sheet Storage Conditions  
Note 2  
Electrostatic Discharge Threshold (HBM)  
Note 2  
Electrostatic Discharge Classification (MIL-STD-883E)  
Class 2  
Note 3  
Typical Electrical/Optical Characteristics at TA = 25°C, If = 150 mA  
Reverse Current  
[I(Vr=5V), μA]  
Full Width Half Max  
Part Number  
Forward Voltage (Vf, V)  
(λD, nm)  
Min.  
Typ.  
3.25  
3.25  
3.25  
3.35  
Max.  
Max.  
Typ.  
21  
C450EZ400-Sxx00-2  
C460EZ400-Sxx00-2  
C470EZ400-Sxx00-2  
C527EZ400-Sxx00-2  
2.9  
2.9  
2.9  
3.0  
3.6  
3.6  
3.6  
3.8  
2
2
2
2
21  
22  
35  
Mechanical Specifications  
Description  
CxxxEZ400-Sxx00-2  
Dimension  
Tolerance  
± 25  
P-N Junction Area (μm)  
Top Area (μm)  
350 x 350  
380 x 380  
380 x 380  
170  
± 25  
Bottom Area (μm)  
± 25  
Chip Thickness (μm)  
± 25  
Au Bond Pad Diameter (μm)  
Au Bond Pad Thickness (μm)  
Back Ohmic Metal Area (μm)  
Back Ohmic Metal Thickness (μm)  
110  
-15, +5  
± 1.0  
± 25  
3.0  
380 x 380  
3.0  
± 0.3  
Notes:  
1. Maximum ratings are package-dependent. The above ratings were determined using a silicone encapsulated chip on MCPCB for  
characterization. The junction temperature should be characterized in a specific package to determine limitations. Assembly  
processing temperature limit is <325°C (< 5 seconds). See the Cree EZBright Applications Note for assembly-process information.  
2. Product resistance to electrostatic discharge (ESD) according to the HBM is measured by simulating ESD using a rapid avalanche  
energy test (RAET). The RAET procedures are designed to approximate the maximum ESD ratings shown. The RAET procedure  
is performed on each die. The ESD classification of Class 2 is based on sample testing according to MIL-STD-883E.  
250  
3. All products conform to the listed minimum and maximum  
specifications for electrical and optical characteristics when  
assembled and operated at 150 mA within the maximum ratings  
shown above. Efficiency decreases at higher currents. Typical  
200  
values given are within the range of average values expected  
by the manufacturer in large quantities and are provided for  
150  
information only. All measurements were made using a Au-  
plated header without an encapsulant. Optical characteristics  
were measured in an integrating sphere using Illuminance E.  
100  
Rth j-a  
Rth j-a  
Rth j-a = 30 °C/W  
=
=
10 °C/W  
20 °C/W  
4. The maximum forward current is determined by the thermal  
resistance between the LED junction and ambient. It is crucial  
for the end-product to be designed in a manner that minimizes  
the thermal resistance from the LED junction to ambient in  
order to optimize product performance.  
50  
0
Rth j-a = 40 °C/W  
25  
50  
75  
100  
125  
150  
5. Specifications are subject to change without notice.  
AmbientTemperature (°C)  
Cree, Inc.  
4600 Silicon Drive  
Durham, NC 27703-8475 USA  
Tel: +1.919.313.5300  
© 2016 Cree, Inc. All rights reserved. The information in this document is subject to change without notice. Cree® and EZBright®  
are registered trademarks, and the Cree logo, EZ™ and EZ400-n™ are trademarks of Cree, Inc.  
Fax: +1.919.313.5778  
www.cree.com/chips  
2
CPR3ED Rev A (201605)