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DATA SHEET
6. Reliability
(1) Datails of the tests
Test Item
Test Condition
Continuous Operation Test
Low Temperature Storage Test
IF=65mAꢀTa=25C × 1000 hours
-40 C × 1000 hours
High Temperature Storage Test 100 C × 1000 hours
Moisture-proof Test
Thermal Shock Test
85 C, 85 %RH for 500 hours
-40 C × 30 minutes – 100 C × 30 minutes, 100 cycle
(2) Judgement Criteria of Failure for Reliability Test
(Ta=25C)
Judgement Criteria for Failure
>U X 1.1
Measuring Item
Forward Voltage
Reverse Current
Symbol
VF
Measuring Condition
IF=65mA
IR
VF=5V
>ꢀU×2
Total Luminous Flux
Φv
IF=65mA
<S X 0.7
U defines the upper limit of the specified characteristics. S defines the initial value.
Note : Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be
return to the normal ambient conditions after the completion of each test.
Symbol
Name
CITILED
CLL130-0101C1-32GV1J7
CITIZEN ELECTRONICS CO.,LTD. JAPAN
Ref.CE-P3322 08/15
CITIZEN [ CITIZEN ELECTRONICS CO., LTD. ]
