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DATA SHEET
6. Reliability
(1) Datails of the tests
Test Item
Continuous Operation Test
Test Condition
IF=50mA Ta=25C × 1000 hours
Low Temperature Storage Test
High Temperature Storage Test
Moisture-proof Test
-40 C × 1000 hours
100 C × 1000 hours
85 C, 85 %RH for 500 hours
-40 C × 30 minutes – 100 C × 30 minutes, 100 cycle
Thermal Shock Test
(2) Judgement Criteria of Failure for Reliability Test
(Ta=25C)
Judgement Criteria for Failure
Measuring Item
Forward Voltage
Reverse Current
Symbol
VF
Measuring Condition
IF=50mA
>U X 1.1
> U×2
IR
VF=5V
Total Luminous Flux
Φv
IF=50mA
<S X 0.7
U defines the upper limit of the specified characteristics. S defines the initial value.
Note : Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be
return to the normal ambient conditions after the completion of each test.
Symbol
Name
CITILED
CLL130-0101B2-353M1C5
CITIZEN ELECTRONICS CO.,LTD. JAPAN
Ref.CE-P2205 03/13ꢀR1(1113)