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DATA SHEET
6. Reliability
(1) Details of the tests
Test Item
Test Condition
Ta=25 C, IF=350 mA× 1000 hours
Continuous Operation Test
Low Temperature Storage Test
High Temperature Storage Test
Moistureꢀproof Test
Ta=ꢀ40 C × 1000 hours
Ta=100 C × 1000 hours
Ta=60 C, 90 %RH for 1000 hours
Thermal Shock Test
ꢀ40 C × 30 minutes – 100 C × 30 minutes, 100 cycle
ꢀRecommended temperature profile (reflow soldering)ꢀ× 2,
ꢀ (2nd test must be started after the samples areꢀstabilized thermally.)
Solder Heat Resistance Test
(2) Judgment Criteria of Failure for Reliability Test
(Ta=25 C)
Measuring Item
Measuring Condition
Judgment Criteria for Failure
Symbol
VF
IF=350mA
Forward Voltage
> U × 1.2
< S × 0.7
Total Luminous Flux
IF=350mA
Φv
U defines the upper limit of the specified characteristics. S defines the initial value.
Note: Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be
returned to the normal ambient conditions after the completion of each test.
Symbol
Name
CITILED
CLꢀL400ꢀMC1L1ꢀA
CITIZEN ELECTRONICS CO., LTD. JAPAN
Ref.CE-P1158 05/11
CITIZEN [ CITIZEN ELECTRONICS CO., LTD. ]
