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DATA SHEET
6. Reliability
(1)Datails of the tests
Test Item
Test Condition
Ta=25 C, IF=350mA× 1000 hours
-40 C × 1000 hours
100 C × 1000 hours
Continuous Operation Test
Low Temperature Storage Test
High Temperature Storage Test
Moisture-proof Test
60 C, 90 %RH for 500 hours
Thermal Shock Test
-40 C × 30 minutes – 100 C × 30 minutes, 100 cycle
Recommended temperature profile (reflow soldering)× 2,
Solder heat resistance test
(2nd test must be started after the samples are stabilized thermally.)
(Ta=25℃)
Judgement Criteria for Failure
>U X 1.1
(2)Judgement Criteria of Failure for Reliability Test
Measuring Item
Symbol
Measuring Condition
IF=350mA
Forward Voltage
VF
IF=350mA
Total Luminous Flux
φv
<S X 0.70
U defines the upper limit of the specified characteristics. S defines the initial value.
Note : Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be
return to the normal ambient conditions after the completion of each test.
Symbol
Name
CITILED
CL-L430-MC1W1-A
CITIZEN ELECTRONICS CO.,LTD. JAPAN
Ref.CE-P1595 10/11