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DATASHEET
6. Reliability
（１）Datails of the tests
Test Item
Test Condition
Continuous Operation Test
IF=350mA Ta=25C × 1000 hours
-40 C × 1000 hours
Low Temperature Storage Test
High Temperature Storage Test 100 C × 1000 hours
Moisture-proof Test
Thermal Shock Test
85 C, 85 %RH for 500 hours
-40 C × 30 minutes – 100 C × 30 minutes, 100 cycle
Recommended temperature profile (reflow soldering) x 2,
(2nd test must be started after the samples are stabilized thermarlly.)
Solder Heat Resistance Test
(2)Judgement Criteria of Failure for Reliability Test
(Ta=25C)
Judgement Criteria for Failure
Measuring Item
Forward Voltage
Total Luminous Flux
Symbol
VF
Φv
Measuring Condition
IF=350mA
>U X 1.2
<S X 0.7
IF=350mA
U defines the upper limit of the specified characteristics. S defines the initial value.
Note : Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be
return to the normal ambient conditions after the completion of each test.
Symbol
Name
CITILED
CL-L400-LC1N1-B
CITIZEN ELECTRONICS CO.,LTD. JAPAN
Ref.CE-P2165 10/12
CITIZEN [ CITIZEN ELECTRONICS CO., LTD. ]
