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DATA SHEET
6. Reliability
(1) Details of the tests
Test Item
Test Condition
Ta=25 C,IF=480 mA× 1000 hours(with Al-fin)
Ta=50 C,IF=480 mA× 1000 hours(with Al-fin)
-40 C × 1000 hours
Continuous Operation Test
Low Temperature Storage Test
High Temperature Storage Test
Moisture-proof Test
100 C × 1000 hours
60 C, 90 %RH for 1000 hours
Thermal Shock Test
-40 C × 30 minutes – 100 C × 30 minutes, 100 cycle
(2) Judgment Criteria of Failure for Reliability Test
(Ta=25 C)
Measuring Item
Measuring Condition
Judgment Criteria for Failure
Symbol
VF
IF=480mA
Forward Voltage
> U × 1.1
< S × 0.85
Total Luminous Flux
IF=480mA
Φv
U defines the upper limit of the specified characteristics. S defines the initial value.
Note: Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be
returned to the normal ambient conditions after the completion of each test.
CL-L251-MC4L reliability test results will be used for CL-L251-MC4L1-C.
CITILED
Symbol
Name
CL-L251-MC4L1-C
CITIZEN ELECTRONICS CO.,LTD. JAPAN
Ref.CE-P1166 05/11 R1(0711)
CITIZEN [ CITIZEN ELECTRONICS CO., LTD. ]
