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DATA SHEET
6. Reliability
(1) Details of the tests
Test Item
Test Condition
ꢀTa=-30C, IF=20mA , 1000 hours(with Al-fin)
ꢀTa=25C, IF=20mA , 1000 hours(with Al-fin)
ꢀTa=85C, IF=20mA , 1000 hours(with Al-fin)
Continuous Operation Test
Low Temperature Storage Test
High Temperature Storage Test
Moisture-proof Test
ꢀTa=-40C , 1000 hours
ꢀTa=100C, 1000 hours
ꢀTa=60C, 90%RH, 1000 hours
ꢀTa=-40C 30minutes~100C 30minuets, 100cycle
Thermal Shock Test
ꢀRecommended temperature profile (reflow soldering)ꢀ× 2,
Solder Heat Resistance Test
ꢀ (2nd test must be started after the samples areꢀstabilized thermally.)
(2) Judgment Criteria of Failure for Reliability Test
Ta=25C
Symbol Measuring Condition Judgment Criteria for Failure
Measuring Item
Forward Voltage
Reverse Current
Luminous Intensity
IF=20mA
VR=5V
VF
IR
> U×1.2
> U×2.0
< S×0.7
IF=20mA
IV
U defines the upper limit of the specified characteristics. S defines the initial value.
* Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be
returned to the normal ambient conditions after the completion of each test.
CITILED
Symbol
Name
CL-824-MU1WW1
CITIZEN ELECTRONICS CO.,LTD. JAPAN
Ref.CE-P1042 04/11