Electrical Characteristics: Refer to the test circuit VDD = 36V, VCC = 5V, TA = 25¡C; unless otherwise specified.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Supply Voltage
10
46
V
Logic Supply Voltage
Logic Supply Current
Reference Input Current
4.75
5.25
15
V
7
mA
mA
VREF = 5V
0.75
1.00
■ Logic Inputs
Input Low Voltage
0.8
V
Input High Voltage
2
V
Low Voltage Input Current
V
IN = 0.4V
(DIRECTION)
(IN0, IN1)
-100
µA
-400
10
µA
µA
High Voltage Input Current VIN = 2.4V
■ Comparators
Comparator Low
Threshold Voltage
Comparator Medium
Threshold Voltage
Comparator High
Threshold Voltage
Comparator Input Current
Cutoff Time
V
REF = 5V
REF = 5V
IN0 = Low
IN1 = High
IN0 = High
IN1 = Low
IN0 = Low
IN1 = Low
66
80
94
mV
mV
mV
V
236
396
251
416
266
436
VREF = 5V
RT = 56k½
±20
37
µA
µs
CT = 820pF
27
Turn Off Delay
2
µs
Output Leakage Current
IN0 =IN1 = High
100
µA
■ Source Diode-Transistor Pair
Saturation Voltage
I
MOTOR = -0.5A conduction period
recirculation period
MOTOR = -1A conduction period
1.7
1.10
2.1
2.1
1.35
2.8
V
V
Saturation Voltage
I
V
recirculation period
VS = 46V
1.7
2.5
V
Leakage Current
300
µA
Diode Forward Voltage
I
MOTOR = -0.5A
1.00
1.3
1.25
1.7
V
V
IMOTOR = -1A
■ Sink Diode-Transistor Pair
Saturation Voltage
I
I
MOTOR = 0.5A
MOTOR = 1A
1.20
1.75
1.45
2.30
V
V
Leakage Current
VS = 46V
MOTOR = 0.5A
IMOTOR = 1A
300
µA
Diode Forward Voltage
I
1.1
1.4
1.5
2.0
V
V
2
CHERRY [ CHERRY SEMICONDUCTOR CORPORATION ]
