BS616LV1010
DATA RETENTION CHARACTERISTICS (TA = -40OC to +85OC)
SYMBOL
VDR
PARAMETER
VCC for Data Retention
Data Retention Current
TEST CONDITIONS
MIN.
1.5
--
TYP. (1)
MAX.
UNITS
CE≧VCC-0.2V
--
0.02
--
--
0.5
--
V
VIN≧VCC-0.2V or VIN≦0.2V
CE≧VCC-0.2V
(3)
ICCDR
uA
ns
ns
VIN≧VCC-0.2V or VIN≦0.2V
Chip Deselect to Data
Retention Time
tCDR
tR
0
See Retention Waveform
(2)
Operation Recovery Time
tRC
--
--
1. VCC=1.5V, TA=25OC and not 100% tested.
2. tRC = Read Cycle Time.
3. ICCDR(Max.) is 0.3uA at TA=70OC.
LOW VCC DATA RETENTION WAVEFORM (CE Controlled)
Data Retention Mode
DR≧1.5V
V
VCC
tCDR
VCC
tR
VCC
CE
CE≧VCC - 0.2V
VIH
VIH
AC TEST CONDITIONS
KEY TO SWITCHING WAVEFORMS
(Test Load and Input/Output Reference)
WAVEFORM
INPUTS
OUTPUTS
Input Pulse Levels
Vcc / 0V
1V/ns
MUST BE
STEADY
MUST BE
STEADY
Input Rise and Fall Times
Input and Output Timing
Reference Level
0.5Vcc
MAY CHANGE
WILL BE CHANGE
FROM “H” TO “L”
FROM “H” TO “L”
tCLZ, tOLZ, tCHZ, tOHZ, tWHZ
CL = 5pF+1TTL
CL = 30pF+1TTL
Output Load
Others
MAY CHANGE
WILL BE CHANGE
FROM “L” TO “H”
FROM “L” TO “H”
ALL INPUT PULSES
DON’T CARE
ANY CHANGE
PERMITTED
CHANGE :
VCC
1 TTL
90%
90%
STATE UNKNOW
Output
10%
10%
GND
CENTER LINE IS
HIGH INPEDANCE
“OFF” STATE
(1)
DOES NOT
APPLY
→
←
→
←
CL
Rise Time:
Fall Time:
1V/ns
1V/ns
1. Including jig and scope capacitance.
Revision
Oct.
2.7
2008
R0201-BS616LV1010
4