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BS616LV1012EC-70 参数 Datasheet PDF下载

BS616LV1012EC-70图片预览
型号: BS616LV1012EC-70
PDF下载: 下载PDF文件 查看货源
内容描述: 非常低的功率/电压CMOS SRAM [Very Low Power/Voltage CMOS SRAM]
分类和应用: 静态存储器
文件页数/大小: 9 页 / 262 K
品牌: BSI [ BRILLIANCE SEMICONDUCTOR ]
 浏览型号BS616LV1012EC-70的Datasheet PDF文件第1页浏览型号BS616LV1012EC-70的Datasheet PDF文件第2页浏览型号BS616LV1012EC-70的Datasheet PDF文件第4页浏览型号BS616LV1012EC-70的Datasheet PDF文件第5页浏览型号BS616LV1012EC-70的Datasheet PDF文件第6页浏览型号BS616LV1012EC-70的Datasheet PDF文件第7页浏览型号BS616LV1012EC-70的Datasheet PDF文件第8页浏览型号BS616LV1012EC-70的Datasheet PDF文件第9页  
BSI  
BS616LV1012  
„ OPERATING RANGE  
„ ABSOLUTE MAXIMUM RATINGS(1)  
AMBIENT  
TEMPERATURE  
0 O C to +70 O  
SYMBOL  
PARAMETER  
RATING  
UNITS  
RANGE  
Vcc  
Terminal Voltage with  
Respect to GND  
-0.5 to  
Vcc+0.5  
-0.5 to  
V
V
TERM  
cc  
V
V
T
T
P
Commercial  
Industrial  
C
2.4V ~ 3.6V  
2.4V ~ 3.6V  
Power Supply Voltage  
Temperature Under Bias  
Storage Temperature  
Power Dissipation  
-40 O C to +85 O  
C
Vcc+0.5  
-40 to +85  
-60 to +150  
1.0  
O C  
O C  
W
BIAS  
STG  
T
„ CAPACITANCE (1) (TA = 25oC, f = 1.0 MHz)  
SYMBOL  
PARAMETER  
CONDITIONS  
MAX.  
UNIT  
DC Output Current  
20  
mA  
OUT  
I
Input  
CIN  
VIN=0V  
6
pF  
Capacitance  
Input/Output  
Capacitance  
1. Stresses greater than those listed under ABSOLUTE MAXIMUM  
RATINGS may cause permanent damage to the device. This is a  
stress rating only and functional operation of the device at these  
or any other conditions above those indicated in the operational  
sections of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods may affect  
reliability.  
CDQ  
VI/O=0V  
8
pF  
1. This parameter is guaranteed and not 100% tested.  
„ DC ELECTRICAL CHARACTERISTICS ( TA = -40oC to + 85oC )  
PARAMETER  
(1)  
UNITS  
PARAMETER  
TEST CONDITIONS  
MIN. TYP.  
MAX.  
NAME  
Guaranteed Input Low  
Voltage  
Vcc=3.0V  
Vcc=3.0V  
IL  
V
-0.5  
--  
0.8  
V
(2)  
Guaranteed Input High  
IH  
V
--  
--  
Vcc+0.3  
1
V
(3)  
2.0  
--  
Voltage  
IN  
IL  
I
Input Leakage Current  
Vcc = Max, V = 0V to Vcc  
uA  
IH  
IH  
Vcc = Max, CE = V , or OE = V ,  
LO  
I
Output Leakage Current  
--  
--  
1
uA  
I/O  
V
= 0V to Vcc  
Vcc=3.0V  
Vcc=3.0V  
OL  
OL  
V
Output Low Voltage  
Output High Voltage  
Vcc = Max, I = 2mA  
--  
--  
--  
0.4  
--  
V
V
OH  
OH  
V
Vcc = Min, I = -1mA  
2.4  
IL  
DQ  
(6)  
CE = V , I = 0mA,  
F = Fmax (4)  
55ns  
70ns  
23  
18  
Operating Power Supply  
Current  
Vcc=3.0V  
Vcc=3.0V  
CC  
I
--  
--  
--  
mA  
mA  
uA  
--  
--  
IH  
DQ  
CCSB  
I
Standby Current-TTL  
CE = V , I = 0mA  
1
(5)  
CCSB1  
CE  
Vcc -0.2V,  
Vcc - 0.2V or V  
I
Standby Current-CMOS  
Vcc=3.0V  
0.4  
2.5  
IN  
IN  
V
0.2V  
1. Typical characteristics are at TA = 25oC.  
3. Overshoot : Vcc+1.5V in case of pulse width 20ns.  
5. IccsB1_Max. is 1.3uA at Vcc=3.0V and TA=70oC.  
2. Undershoot : -1.5V in case of pulse width 20ns.  
4. Fmax = 1/tRC  
6. Icc_Max. is 22mA(@55ns)/17mA(@70ns) at Vcc=3.0V and TA=0~70oC.  
.
„ DATA RETENTION CHARACTERISTICS ( TA = -40oC to + 85oC )  
SYMBOL  
PARAMETER  
TEST CONDITIONS  
MIN.  
TYP. (1) MAX.  
UNITS  
CE Vcc - 0.2V  
VIN Vcc - 0.2V or VIN 0.2V  
VDR  
Vcc for Data Retention  
1.5  
--  
--  
V
CE Vcc - 0.2V  
VIN Vcc - 0.2V or VIN 0.2V  
(3)  
ICCDR  
Data Retention Current  
--  
0
0.15  
0.8  
uA  
Chip Deselect to Data  
Retention Time  
tCDR  
tR  
--  
--  
--  
--  
ns  
ns  
See Retention Waveform  
(2)  
Operation Recovery Time  
TRC  
1. Vcc = 1.5V, TA = + 25OC  
3. IccDR_MAX. is 0.45uA at TA=70OC.  
2. tRC = Read Cycle Time  
Revision 1.0  
R0201-BS616LV1012  
3
Apr.  
2004