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BS616LV4010AIP70 参数 Datasheet PDF下载

BS616LV4010AIP70图片预览
型号: BS616LV4010AIP70
PDF下载: 下载PDF文件 查看货源
内容描述: [Standard SRAM, 256KX16, 70ns, CMOS, PBGA48]
分类和应用: 静态存储器内存集成电路
文件页数/大小: 9 页 / 269 K
品牌: BSI [ BRILLIANCE SEMICONDUCTOR ]
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BSI  
BS616LV4010  
„ OPERATING RANGE  
„ ABSOLUTE MAXIMUM RATINGS(1)  
SYMBOL  
VTERM  
TBIAS  
TSTG  
PARAMETER  
Terminal Voltage with  
Respect to GND  
RATING  
-0.5 to  
Vcc+0.5  
UNITS  
AMBIENT  
TEMPERATURE  
0O C to +70O  
RANGE  
Vcc  
V
Commercial  
Industrial  
C
2.7V ~ 3.6V  
2.7V ~ 3.6V  
Temperature Under Bias  
Storage Temperature  
Power Dissipation  
-40 to +125  
-60 to +150  
1.0  
O C  
O C  
W
-40O C to +85O  
C
PT  
„ CAPACITANCE (1) (TA = 25oC, f = 1.0 MHz)  
DC Output Current  
20  
mA  
IOUT  
SYMBOL  
PARAMETER CONDITIONS MAX.  
UNIT  
Input  
1. Stresses greater than those listed under ABSOLUTE MAXIMUM  
RATINGS may cause permanent damage to the device. This is a  
stress rating only and functional operation of the device at these  
or any other conditions above those indicated in the operational  
sections of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods may affect  
reliability.  
CIN  
VIN=0V  
=0V  
6
8
pF  
Capacitance  
Input/Output  
Capacitance  
DQ  
C
I/O  
V
pF  
1. This parameter is guaranteed and not 100% tested.  
„ DC ELECTRICAL CHARACTERISTICS ( TA = 0 to + 70oC )  
PARAMETER  
(1 )  
UNITS  
PARAMETER  
TEST CONDITIONS  
MIN. TYP.  
MAX.  
0.8  
NAME  
Guaranteed Input Low  
Voltage(2)  
IL  
Vcc=3.0V  
Vcc=3.0V  
V
-0.5  
2.0  
--  
--  
V
V
Guaranteed Input High  
IH  
Voltage (2)  
V
--  
--  
Vcc+0.2  
1
Vcc = Max, VIN = 0V to Vcc  
IL  
Vcc=3.0V  
I
Input Leakage Current  
uA  
,
Vcc = Max, CE = VIH, or OE = VIH  
LO  
OL  
I
Output Leakage Current  
Output Low Voltage  
Output High Voltage  
--  
--  
--  
--  
--  
1
0.4  
--  
uA  
V
I/O  
V
= 0V toVcc  
Vcc=3.0V  
Vcc=3.0V  
OL  
V
Vcc = Max, I = 2mA  
OH  
V
Vcc = Min, IOH = -1mA  
2.4  
V
(3)  
Operating Power Supply  
Current  
IL  
DQ  
CE = V , I = 0mA, F =Fmax  
CC  
Vcc=3.0V  
Vcc=3.0V  
I
--  
--  
--  
--  
20  
1
mA  
mA  
CCSB  
IH  
DQ  
I
Standby Current-TTL  
CE = V , I = 0mA  
CE Vcc-0.2V,  
CCSB1  
Vcc=3.0V  
I
Standby Current-CMOS  
--  
0.5  
8
uA  
IN  
V
Vcc - 0.2V or VIN 0.2V  
1. Typical characteristics are at TA = 25oC.  
2. These are absolute values with respect to device ground and all overshoots due to system or tester notice are included.  
3. Fmax = 1/tRC  
.
„ DATA RETENTION CHARACTERISTICS ( TA = 0 to + 70oC )  
(1)  
SYMBOL  
PARAMETER  
TEST CONDITIONS  
MIN. TYP.  
MAX.  
UNITS  
CE  
Vcc - 0.2V  
Vcc - 0.2V or V  
VDR  
Vcc for Data Retention  
1.5  
--  
--  
V
IN  
IN  
V
0.2V  
0.2V  
CE  
Vcc - 0.2V  
Vcc - 0.2V or V  
ICCDR  
Data Retention Current  
--  
0
0.3  
1
uA  
IN  
IN  
V
Chip Deselect to Data  
Retention Time  
tCDR  
tR  
--  
--  
--  
--  
ns  
ns  
See Retention Waveform  
(2)  
Operation Recovery Time  
TRC  
1. Vcc = 1.5V, TA = + 25OC  
2. tRC = Read Cycle Time  
Revision 2.4  
Jan. 2004  
R0201-BS616LV4010  
3