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ADS7825U 参数 Datasheet PDF下载

ADS7825U图片预览
型号: ADS7825U
PDF下载: 下载PDF文件 查看货源
内容描述: 4通道,16位采样CMOS A / D转换器 [4 Channel, 16-Bit Sampling CMOS A/D Converter]
分类和应用: 转换器模数转换器光电二极管
文件页数/大小: 16 页 / 344 K
品牌: BB [ BURR-BROWN CORPORATION ]
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SPECIFICATIONS (CONT)  
ELECTRICAL  
At TA = –40°C to +85°C, fS = 40kHz, VS1 = VS2 = VS = +5V ±5%, using external reference, CONTC = 0V, unless otherwise specified.  
ADS7825P, U  
TYP  
ADS7825PB, UB  
PARAMETER  
CONDITIONS  
MIN  
MAX  
MIN  
TYP  
MAX  
UNITS  
DIGITAL TIMING  
Bus Access Time  
Bus Relinquish Time  
Data Clock  
Internal Clock (Output only when  
transmitting data)  
External Clock  
PAR/SER = +5V  
PAR/SER = +5V  
PAR/SER = 0V  
EXT/INT LOW  
83  
83  
ns  
ns  
0.5  
0.1  
1.5  
10  
MHz  
MHz  
EXT/INT HIGH  
POWER SUPPLIES  
VS1 = VS2 = VS  
Power Dissipation  
+4.75  
+5  
50  
+5.25  
50  
V
mW  
µW  
fS = 40kHz  
PWRD HIGH  
TEMPERATURE RANGE  
Specified Performance  
Storage  
–40  
–65  
+85  
+150  
°C  
°C  
Thermal Resistance (θJA  
)
Plastic DIP  
SOIC  
75  
75  
°C/W  
°C/W  
NOTES: (1) An asterik () specifies same value as grade to the left. (2) LSB means Least Significant Bit. For the 16-bit, ±10V input ADS7825, one LSB is 305µV. (3)  
Typical rms noise at worst case transitions and temperatures. (4) Full scale error is the worst case of –Full Scale or +Full Scale untrimmed deviation from ideal first and  
last code transitions, divided by the transition voltage (not divided by the full-scale range) and includes the effect of offset error. (5) All specifications in dB are referred  
to a full-scale ±10V input. (6) A full scale sinewave input on one channel will be attenuated by this amount on the other channels. (7) Useable Bandwidth defined as  
Full-Scale input frequency at which Signal-to-(Noise+Distortion) degrades to 60dB, or 10 bits of accuracy. (8) The ADS7825 will accurately acquire any input step if given  
a full acquisition period after the step. (9) Recovers to specified performance after 2 x FS input overvoltage, and normal acquisitions can begin.  
PACKAGE/ORDERING INFORMATION  
PACKAGE  
DRAWING  
NUMBER(1)  
MINIMUM SIGNAL-  
TO-(NOISE + DISTORTION)  
RATIO (dB)  
TEMPERATURE  
RANGE  
MAXIMUM INTEGRAL  
LINEARITY ERROR (LSB)  
PRODUCT  
PACKAGE  
ADS7825P  
ADS7825PB  
ADS7825U  
ADS7825UB  
Plastic Dip  
Plastic Dip  
SOIC  
246  
246  
217  
217  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
±3  
±2  
±3  
±2  
83  
86  
83  
86  
SOIC  
NOTE: (1) For detailed drawing and dimension table, please see end of data sheet, or Appendix C of Burr-Brown IC Data Book.  
ABSOLUTE MAXIMUM RATINGS  
PIN CONFIGURATION  
TOP VIEW  
DIP/SOIC  
Analog Inputs: AIN0, AIN1, AIN2, AIN3 .............................................. ±15V  
REF ................................... (AGND2 –0.3V) to (VS + 0.3V)  
CAP ........................................Indefinite Short to AGND2,  
Momentary Short to VS  
1
2
3
4
5
6
7
8
9
28  
27  
VS1  
VS2  
AGND1  
AIN0  
VS1 and VS2 to AGND2........................................................................... 7V  
VS1 to VS2 .......................................................................................... ±0.3V  
Difference between AGND1, AGND2 and DGND ............................. ±0.3V  
Digital Inputs and Outputs.......................................... –0.3V to (VS + 0.3V)  
Maximum Junction Temperature ..................................................... 150°C  
Internal Power Dissipation ............................................................. 825mW  
Lead Temperature (soldering, 10s)................................................ +300°C  
Maximum Input Current to Any Pin ................................................. 100mA  
AIN1  
26 PWRD  
25 CONTC  
24 BUSY  
23 CS  
AIN2  
AIN3  
CAP  
REF  
22 R/C  
ADS7825  
ELECTROSTATIC  
DISCHARGE SENSITIVITY  
This integrated circuit can be damaged by ESD. Burr-Brown  
recommends that all integrated circuits be handled with  
appropriate precautions. Failure to observe proper handling  
and installation procedures can cause damage.  
AGND2  
D7  
21 BYTE  
20 PAR/SER  
19 A0  
TRI-STATE  
TRI-STATE  
TRI-STATE  
EXT/INT  
D6 10  
D5 11  
18 A1  
D4 12  
17 D0  
TAG  
16 D1  
SYNC  
D3 13  
SDATA  
DATACLK  
ESD damage can range from subtle performance degrada-  
tion to complete device failure. Precision integrated circuits  
may be more susceptible to damage because very small  
parametric changes could cause the device not to meet its  
published specifications.  
DGND 14  
15 D2  
®
ADS7825  
3