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ADS774JP 参数 Datasheet PDF下载

ADS774JP图片预览
型号: ADS774JP
PDF下载: 下载PDF文件 查看货源
内容描述: 微处理器兼容采样CMOS模拟数字转换器 [Microprocessor-Compatible Sampling CMOS ANALOG-to-DIGITAL CONVERTER]
分类和应用: 转换器微处理器光电二极管
文件页数/大小: 13 页 / 415 K
品牌: BB [ BURR-BROWN CORPORATION ]
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ABSOLUTE MAXIMUM RATINGS  
ELECTROSTATIC  
DISCHARGE SENSITIVITY  
This integrated circuit can be damaged by ESD. Burr-Brown  
recommends that all integrated circuits be handled with  
appropriate precautions. Failure to observe proper handling  
and installation procedures can cause damage.  
VEE to Digital Common....................................................... +VDD to –16.5V  
VDD to Digital Common .............................................................. 0V to +7V  
Analog Common to Digital Common .................................................... ±1V  
Control Inputs (CE, CS, AO, 12/8, R/C)  
to Digital Common .................................................. –0.5V to VDD +0.5V  
Analog Inputs (Ref In, Bipolar Offset, 10VIN  
)
to Analog Common ...................................................................... ±16.5V  
20VIN to Analog Common .................................................................. ±24V  
Ref Out.......................................................... Indefinite Short to Common,  
Momentary Short to VDD  
Max Junction Temperature ............................................................ +165°C  
Power Dissipation ........................................................................ 1000mW  
Lead Temperature (soldering,10s) ................................................. +300°C  
Thermal Resistance, θJA : Plastic DIPs ........................................ 100°C/W  
SOIC ................................................... 100°C/W  
ESD damage can range from subtle performance degrada-  
tion to complete device failure. Precision integrated circuits  
may be more susceptible to damage because very small  
parametric changes could cause the device not to meet its  
published specifications.  
PACKAGE/ORDERING INFORMATION  
TEMPERATURE  
LINEARITY  
ERROR  
PACKAGE DRAWING  
NUMBER(2)  
PRODUCT  
SINAD(1)  
RANGE  
PACKAGE  
ADS774JE  
ADS774KE  
ADS774JP  
ADS774KP  
ADS774JU  
ADS774KU  
68dB  
70dB  
68dB  
70dB  
68dB  
70dB  
0°C to +70°C  
0°C to +70°C  
0°C to +70°C  
0°C to +70°C  
0°C to +70°C  
0°C to +70°C  
±1LSB  
±1/2LSB  
±1LSB  
±1/2LSB  
±1LSB  
28-Pin 0.3" Plastic DIP  
28-Pin 0.3" Plastic DIP  
28-Pin 0.6" Plastic DIP  
28-Pin 0.6" Plastic DIP  
28-Lead SOIC  
246  
246  
215  
215  
217  
217  
±1/2LSB  
28-Lead SOIC  
NOTES: (1) SINAD is Signal-to-(Noise + Distortion) expressed in dB. (2) For detailed drawing and dimension table, please see end of data sheet, or Appendix C of Burr-  
Brown IC Data Book.  
CONNECTION DIAGRAM  
+5VDC Supply  
(VDD  
Power-Up Reset  
1
28  
27  
STATUS  
)
12/8  
2
3
4
5
6
DB11 (MSB)  
Control  
Logic  
CS  
AO  
26 DB10  
Clock  
25  
24  
DB9  
DB8  
R/C  
CE  
23  
DB7  
22 DB6  
21 DB5  
NC*  
7
8
12  
Bits  
2.5V Ref  
Out  
2.5V  
Reference  
12 Bits  
Analog  
Common  
20  
19 DB3  
18  
9
DB4  
2.5V Ref  
In  
10  
VEE 11  
DB2  
17 DB1  
Bipolar 12  
Offset  
+
10V Range 13  
16 DB0 (LSB)  
CDAC  
20V Range  
14  
15 Digital  
Common  
*Not Internally Connected  
®
ADS774  
4