UVEPROM
AS27C256
Austin Semiconductor, Inc.
CAPACITANCE OVER RECOMMENDED RANGES OF SUPPLY VOLTAGE AND OPERAT-
ING FREE-AIR TEMPERATURE, f = 1MHz*
PARAMETER
TEST CONDITIONS TYP**
MAX
UNIT
6
10
pF
Ci
VI = 0V
Input capacitance
10
14
pF
Co
VO = 0V
Output capacitance
* Capacitance measurements are made on a sample basis only.
** Typical values are at TA = 25°C and nominal voltages.
SWITCHING CHARACTERISTICS OVER RECOMMENDED RANGES OF SUPPLY VOLT-
AGE AND OPERATING FREE-AIR TEMPERATURE1,2
TEST
CONDITIONS1, 2
-12
-15
PARAMETER
UNIT
MIN MAX MIN MAX
Access time from address
Access time from E\
120
120
40
150
150
50
ns
ns
ns
ta(A)
ta(E)
Output enable time from G\
ten(G)R
see Figure 2
Disable time of output from G\ or E\,
whichever occurs first3
0
0
30
0
0
30
ns
ns
tdis
Output data valid time after change of
address, E\, or G\, whichever occurs first3
tv(A)
TEST
CONDITIONS1, 2
-17
-20
-25
PARAMETER
UNIT
MIN MAX MIN MAX MIN MAX
Access time from address
Access time from E\
170
170
50
200
200
60
250
250
60
ns
ns
ns
ta(A)
ta(E)
Output enable time from G\
ten(G)R
see Figure 2
Disable time of output from G\ or E\,
whichever occurs first3
0
0
40
0
0
50
0
0
60
ns
ns
tdis
Output data valid time after change of
address, E\, or G\, whichever occurs first3
tv(A)
NOTES:
1.Timing measurements are made at 2V for logic high and 0.8V for logic low (see figure 2).
2. Common test conditions apply for tdis except during programming.
3. Value calculated from 0.5V delta to measured output level. This parameter is only sampled and not 100% tested.
SWITCHING CHARACTERISTICS FOR PROGRAMMING:VCC = 6.5V and VPP = 12.75V (AMD
FLASHRITE ALGO),TA = 25°C
PARAMETER
MIN
MAX
UNIT
Output disable time from G\
0
130
ns
tdis(G)
Output enable time from G\
150
ns
ten(G)W
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
AS27C256
Rev. 2.0 7/06
7
AUSTIN [ AUSTIN SEMICONDUCTOR ]
