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S3006D-6 参数 Datasheet PDF下载

S3006D-6图片预览
型号: S3006D-6
PDF下载: 下载PDF文件 查看货源
内容描述: [TRANSCEIVER, PQFP80, HEAT SINK, PLASTIC, QFP-80]
分类和应用: ATM异步传输模式电信电信集成电路
文件页数/大小: 28 页 / 280 K
品牌: AMCC [ APPLIED MICRO CIRCUITS CORPORATION ]
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SONET/SDH OC-3/12 TRANSMITTER AND RECEIVER  
S3005/S3006  
Line Loopback  
The CMI decoder block on the S3006 SERI accepts  
serial data from the RSDP/N input at the TSCLK rate  
(311.04 MHz or 278.528 MHz). The data is then de-  
coded from CMI to NRZ format and converted from  
serial to parallel at one half the TSCLK rate.  
The Line Loopback circuitry consists of alternate  
clock and data output drivers. For the S3005, it selects  
the source of the data and clock which is output on TSD  
and TSCLK. When the Line Loopback Enable input  
(LLEB) is high, it selects data and clock from the Parallel  
to Serial Converter block or the CMI Encoder block.  
When LLEB is low, it forces the output data multiplexor  
to select data and clock from the LLD and LLCLK  
inputs. When these inputs are connected to the Line  
Loop Clock (LLCLK) and Line Loop Data (LLD) out-  
puts of a S3006 receiver, a receive-to-transmit  
loopback can be established at the serial data rate.  
Note that in CMI operating mode, the data bit rate is  
one half of the recovered clock rate.  
Diagnostic Loopback  
The Diagnostic Loopback path consists of alternate  
serial data outputs (in the case of the S3005) and  
inputs (in the case of the S3006).  
On the S3005, the differential ECL output DLD pro-  
vides Diagnostic Loopback serial data. When the  
Diagnostic Loopback Enable (DLEB) input is low,  
this data output is a replica of TSD. When DLD is  
connected to the S3006, a loopback from the trans-  
mitter to the receiver at the serial data rate can be  
set up for diagnostic purposes. When DLEB is high,  
DLD is held in the inactive state, with the positive  
output high and the negative output low. In the inac-  
tive state, there will be no interference from the  
transmitter to the receiver. The DLD outputs on the  
S3005 should be held inactive (DLEB high) when not  
in use to avoid potential crosstalk of the asynchro-  
nous DLD signals with the serial data signals.  
Test and Bypass Modes  
The Test Clock Enable (TESTEN) inputs on both  
chips provide access to the PLL.  
The PLL-generated clock source on both the S3005  
and S3006 can be bypassed by setting TESTEN  
high. In this mode, an externally generated bit serial  
clock source must be applied at the REFCLK input.  
Table 6 lists the possible combinations allowed in  
bypass mode.  
On the receiver side, the differential ECL input DLD  
is the Diagnostic Loopback serial data input. When  
the Diagnostic Loopback Enable (DLEB) input is set  
low, the DLD input is routed in place of the normal  
data stream (RSD).  
Table 6. Bypass Mode  
TESTEN  
MODE[2:0]  
Reference Clock Frequency  
Serial Data Rate  
(Mbit/s)  
In Bypass Mode  
0
XXX  
Normal Operating Mode  
(See Table 2)  
1
1
1
1
100  
101  
101  
110  
622.08  
311.04  
278.528  
155.52  
622.08  
155.52 CMI  
139.264 CMI  
155.52  
Applied Micro Circuits Corporation  
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